Analytical simulation of a three dimensional temperature field produced by planar defects of any shape: Application to non-destructive testing

@inproceedings{Degiovanni580,
    author    = { A. Degiovanni and Abdel Hakim Bendada and Jean-Christophe Batsale and D. Maillet },
    title     = { Analytical simulation of a three dimensional temperature field produced by planar defects of any shape: Application to non-destructive testing },
    booktitle = { Quantitative Infrared Thermography (QIRT’94) },
    pages     = { 251-259 },
    address   = { Sorrento, Italy },
    year      = { 1994 },
    month     = { August 23-26 }
}

Last modification: 2005/08/25 by bendada