Defect Characterization in Pulsed Thermography: A Statistical Method Compared with Kohonen and Perceptron Neural Networks

@article{Vallerand151,
    author    = { Steve Vallerand and Xavier Maldague },
    title     = { Defect Characterization in Pulsed Thermography: A Statistical Method Compared with Kohonen and Perceptron Neural Networks },
    volume    = { 33 },
    number    = { 4 },
    pages     = { 307-315 },
    year      = { 2000 },
    journal   = { Nondestructive Testing and Evaluation International }
}

Last modification: 2002/10/25 by maldagx