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Title |
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| [341] |
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Xavier Maldague, A. Nouah, L. Fortin, F. Robitaille and J. Picard,
"Non-planar inspection with infrared thermography",
in 13th World Conference on Non -Destructive Testing(C. Hallai, P. Kulcsar ed.), pp. 725-729, 1992. |
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| [342] |
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Xavier Maldague, A. Nouah, L. Fortin, F. Robitaille and J. Picard,
"Non-planar inspection with infrared thermography",
in 13th World Conference on Non -Destructive Testing(C. Hallai, P. Kulcsar ed.), pp. 725-729, 1992. |
|
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| [343] |
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Xavier Maldague, A. Nouah, L. Fortin, F. Robitaille and J. Picard,
"Non-planar inspection with infrared thermography",
in 13th World Conference on Non -Destructive Testing(C. Hallai, P. Kulcsar ed.), pp. 725-729, 1992. |
|
|
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| [344] |
|
Xavier Maldague, A. Nouah, L. Fortin, F. Robitaille and J. Picard,
"Non-planar inspection with infrared thermography",
in 13th World Conference on Non -Destructive Testing(C. Hallai, P. Kulcsar ed.), pp. 725-729, 1992. |
|
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| [345] |
|
Xavier Maldague, A. Nouah, L. Fortin, F. Robitaille and J. Picard,
"Non-planar inspection with infrared thermography",
in 13th World Conference on Non -Destructive Testing(C. Hallai, P. Kulcsar ed.), pp. 725-729, 1992. |
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| [346] |
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A. Bergeron, Martin D'Anjou, E. Eustache, R. Lemieux, Langis Pitre, Benoît Ricard, Robert Wolfe and Xavier Maldague,
"Local Identification of Features by Image Analysis",
in Congrès Canadien en génie électrique et informatique, (Toronto, Ontario), 13 - 16 Sept. 1992. |
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| [347] |
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A. Bergeron, Martin D'Anjou, E. Eustache, R. Lemieux, Langis Pitre, Benoît Ricard, Robert Wolfe and Xavier Maldague,
"Local Identification of Features by Image Analysis",
in Congrès Canadien en génie électrique et informatique, (Toronto, Ontario), 13 - 16 Sept. 1992. |
|
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| [348] |
|
A. Bergeron, Martin D'Anjou, E. Eustache, R. Lemieux, Langis Pitre, Benoît Ricard, Robert Wolfe and Xavier Maldague,
"Local Identification of Features by Image Analysis",
in Congrès Canadien en génie électrique et informatique, (Toronto, Ontario), 13 - 16 Sept. 1992. |
|
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| [349] |
|
A. Bergeron, Martin D'Anjou, E. Eustache, R. Lemieux, Langis Pitre, Benoît Ricard, Robert Wolfe and Xavier Maldague,
"Local Identification of Features by Image Analysis",
in Congrès Canadien en génie électrique et informatique, (Toronto, Ontario), 13 - 16 Sept. 1992. |
|
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| [350] |
|
A. Bergeron, Martin D'Anjou, E. Eustache, R. Lemieux, Langis Pitre, Benoît Ricard, Robert Wolfe and Xavier Maldague,
"Local Identification of Features by Image Analysis",
in Congrès Canadien en génie électrique et informatique, (Toronto, Ontario), 13 - 16 Sept. 1992. |
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