Defect Quantification with Reference-Free Thermal Contrast and Artificial Neural Networks

@inproceedings{Benitez669,
    author    = { Hernan Dario Benitez and Clemente Ibarra-Castanedo and Xavier Maldague and Abdel Hakim Bendada and Humberto Loaiza },
    title     = { Defect Quantification with Reference-Free Thermal Contrast and Artificial Neural Networks },
    booktitle = { SPIE - The International Society for Optical Engineering, Thermosense XXIX },
    address   = { Orlando, FL, USA },
    year      = { 2007 },
    month     = { 9-13 April }
}

Dernière modification: 2007/01/10 par bendada