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CERVIM

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MIVIM

Titre
[151] Xavier Maldague,
"Infrared Thermography For Nondestructive Testing",
in 3rd CanSmart, (Saint-Hubert, Quebec), pp. 37-47, Sept. 28-29 2000.
[152] François Galmiche and Xavier Maldague,
"Depth defect retrieval using the wavelet pulsed phased thermography",
in ASNT Fall conference, 2000.
[153] Xavier Maldague,
"Applications of Infrared Thermography in NonDestructive Evaluation",
in Trends in Optical Nondestructive Testing (invited chapter)(Pramod Rastogi ed.), pp. 591-609, Elsevier, 2000.
[154] Steve Vallerand and Xavier Maldague,
"Defect Characterization in Pulsed Thermography: A Statistical Method Compared with Kohonen and Perceptron Neural Networks",
Nondestructive Testing and Evaluation International, vol. 33, no 4, pp. 307-315, 2000.
[155] R.W. Diraddo, Daniel Laroche, Abdel Hakim Bendada and T. Ots,
"Optimization of thermoforming with process modeling",
in ANTEC’99, Society of Plastics Engineers, (New York, NY, USA), pp. 844-849, May 2-6 1999.
[156] Abdel Hakim Bendada and K.T. Nguyen,
"Estimation of the initial temperature profile and the heat transfer coefficient in polymer processing by an inverse method",
in 3rd International Conference on Inverse Problems in Engineering: Theory and Practice, (Port Ludlow, Washington, USA), pp. 355-361, June 1999.
[157] A. Attar, Abdel Hakim Bendada, R.W. Diraddo and M. Ahern,
"Evaluation of a metallic reinforced epoxy mold for blow molding",
in Structural Plastics ’99 Proceedings, (Boston, Massachusetts, USA), pp. 151-158, April 18-20 1999.
[158] Abdel Hakim Bendada, K.T. Nguyen and C.A. Loong,
"Application of infrared imaging in optimizing the induction heating of semi-solid aluminum alloys",
in 38th Conference of Metallurgists of CIM, Proceedings of the International Symposium on Advanced Sensors for Metals Processing, (Quebec City, Canada), pp. 331-342, August 22-26 1999.
[159] Steve Vallerand, Akbar Darabi and Xavier Maldague,
"Defect Detection in Pulsed Thermography: A Comparison of Kohonen and Perceptron Neural Networks",
in SPIE: Thermosense XXI, (SPIE: Society of Photo-Optical Instrumentation Engineers)(R.N. Wurzbach, D.D. Burleigh ed.), (Orlando, Fl), pp. 20-25, April 1999.
[160] Carl Fortin, François Galmiche, Steve Vallerand and Xavier Maldague,
"Surface defect detection on thin metal sheets",
in 5th Conf. on QCAV 1999 (Quality Control by Artificial Vision), (Trois-Rivières, QC), pp. 271-273, May 18-21 1999.
   
     
   
   

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