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Titre |
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| [171] |
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Xavier Maldague, J. C. Krapez, P. Cielo and Denis Poussart,
"Infrared Thermographic Inspection by Internal Temperature Perturbation Techniques",
in Twelfth World Conference on Non Destructive Testing(J. Boogaard, G.M. van Dijk ed.), (Amsterdam, Netherlands), pp. 561-566, Elsevier, April 23 - 29 1989. |
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| [172] |
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Xavier Maldague, J. C. Krapez, P. Cielo and Denis Poussart,
"Infrared Thermographic Inspection by Internal Temperature Perturbation Techniques",
in Twelfth World Conference on Non Destructive Testing(J. Boogaard, G.M. van Dijk ed.), (Amsterdam, Netherlands), pp. 561-566, Elsevier, April 23 - 29 1989. |
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| [173] |
|
Xavier Maldague, J. C. Krapez, P. Cielo and Denis Poussart,
"Infrared Thermographic Inspection by Internal Temperature Perturbation Techniques",
in Twelfth World Conference on Non Destructive Testing(J. Boogaard, G.M. van Dijk ed.), (Amsterdam, Netherlands), pp. 561-566, Elsevier, April 23 - 29 1989. |
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| [174] |
|
Xavier Maldague, J. C. Krapez, P. Cielo and Denis Poussart,
"Infrared Thermographic Inspection by Internal Temperature Perturbation Techniques",
in Twelfth World Conference on Non Destructive Testing(J. Boogaard, G.M. van Dijk ed.), (Amsterdam, Netherlands), pp. 561-566, Elsevier, April 23 - 29 1989. |
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| [175] |
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Xavier Maldague, J. C. Krapez and P. Cielo,
"Subsurface Flaw Detection in Reflective Materials by Thermal- Transfer Imaging",
in Proc. SPIE: Thermosense XI(G.B. McIntosh ed.), (Orlando, Fl), pp. 163 - 174, April 1989. |
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| [176] |
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Xavier Maldague, J. C. Krapez and P. Cielo,
"Subsurface Flaw Detection in Reflective Materials by Thermal- Transfer Imaging",
in Proc. SPIE: Thermosense XI(G.B. McIntosh ed.), (Orlando, Fl), pp. 163 - 174, April 1989. |
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| [177] |
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Xavier Maldague, J. C. Krapez and P. Cielo,
"Subsurface Flaw Detection in Reflective Materials by Thermal- Transfer Imaging",
in Proc. SPIE: Thermosense XI(G.B. McIntosh ed.), (Orlando, Fl), pp. 163 - 174, April 1989. |
|
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| [178] |
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Xavier Maldague, J. C. Krapez and P. Cielo,
"Subsurface Flaw Detection in Reflective Materials by Thermal- Transfer Imaging",
in Proc. SPIE: Thermosense XI(G.B. McIntosh ed.), (Orlando, Fl), pp. 163 - 174, April 1989. |
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| [179] |
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P. Cielo, J. C. Krapez, Xavier Maldague, M. Lamontagne and G. Vaudreuil,
"Nondestructive inspection by in-process optical sensors",
in Can. Soc. of Nondestructive Testing 1990 Fall Conference, (Montréal, QC), Sept.14-15 1990. |
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| [180] |
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P. Cielo, J. C. Krapez, Xavier Maldague, M. Lamontagne and G. Vaudreuil,
"Nondestructive inspection by in-process optical sensors",
in Can. Soc. of Nondestructive Testing 1990 Fall Conference, (Montréal, QC), Sept.14-15 1990. |
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