 |
|
|
 |
Titre |
|
| [1] |
|
Clemente Ibarra-Castanedo, Daniel Gonzalez, Matthieu Klein, Mariacristina Pilla, Steve Vallerand and Xavier Maldague,
"Infrared Image Processing and Data Analysis",
Infrared Physics, vol. 46, no 1-2, pp. 75-83, Dec. 2004. |
|
|
|
| [2] |
|
Clemente Ibarra-Castanedo, Daniel Gonzalez, Matthieu Klein, Mariacristina Pilla, Steve Vallerand and Xavier Maldague,
"Infrared Image Processing and Data Analysis",
in VII Workshop on Advances in Infrared Technology and Applications (7th AITA), (Pisa, Italy), Sept. 9-12 2003. |
|
|
|
| [3] |
|
Clemente Ibarra-Castanedo, François Galmiche, Akbar Darabi, Mariacristina Pilla, Matthieu Klein, Adel Ziadi, Steve Vallerand, Jean-François Pelletier and Xavier Maldague,
"Thermographic nondestructive evaluation: overview of recent progress",
SPIE: Society of Photo-Optical Instrumentation Engineers, vol. SPIE Proc. Thermosense XXV, April 2003. |
|
|
|
| [4] |
|
François Galmiche, Steve Vallerand and Xavier Maldague,
"Pulsed Phase Thermography with the Wavelet Transform",
in Review of Progress in Quantitative NDE(D.O. Thompson and D.E. Chimenti ed.), ((Montréal 1999)), pp. 609-615, Am. Institute of Physics, 2000. |
|
|
|
| [5] |
|
François Galmiche, Steve Vallerand and Xavier Maldague,
"Wavelet Transform Applied to Pulsed Phased Thermography",
in V Workshop on Advances in Infrared Technology and Applications (5th AITA), keynote lecture(E. Grinzato, P.G. Bison, A. Mazzoldi ed.), pp. 117-122, CNR, 2000. |
|
|
|
| [6] |
|
Steve Vallerand and Xavier Maldague,
"Defect Characterization in Pulsed Thermography: A Statistical Method Compared with Kohonen and Perceptron Neural Networks",
Nondestructive Testing and Evaluation International, vol. 33, no 4, pp. 307-315, 2000. |
|
|
|
| [7] |
|
Steve Vallerand, Akbar Darabi and Xavier Maldague,
"Defect Detection in Pulsed Thermography: A Comparison of Kohonen and Perceptron Neural Networks",
in SPIE: Thermosense XXI, (SPIE: Society of Photo-Optical Instrumentation Engineers)(R.N. Wurzbach, D.D. Burleigh ed.), (Orlando, Fl), pp. 20-25, April 1999. |
|
|
|
| [8] |
|
Carl Fortin, François Galmiche, Steve Vallerand and Xavier Maldague,
"Surface defect detection on thin metal sheets",
in 5th Conf. on QCAV 1999 (Quality Control by Artificial Vision), (Trois-Rivières, QC), pp. 271-273, May 18-21 1999. |
|
|
|
|
|
